March 2024
Correlate Issues with Device Attributes
Users can now view the distribution of issues by device attributes in the issue view. Within the issue view users can now select an attribute from the drop down and see the distribution of that specific issue by the attribute selected in the same way as you can see distribution of issue by software version or hardware type. This is an extremely powerful tool to identify correlations between issues occurring across your fleet and things like production batch or device tree information such as chip type.
Currently correlations are best used for attributes that are fixed for the life of the device because the correlation is based on the most recently reported state of the attribute on the device and not the attribute at the time the issue occurred. This means it’s good for correlating with things like production batch, and not good for correlating with things like state of charge. For more information on issue attribute correlation please read our technical documentation.
Device Vitals: Improved Searching and Filtering
We have made a number of enhancements to our Device Vitals feature set designed to make it easier to go from top level insight to device level investigation. Firstly, we have introduced a set of templated dashboards for each Device Vital that can be selected when creating a new dashboard and will pre-populate with our recommended chart and card types.
We have also introduced two ways to get to a list of devices based on their performance on a specific Device Vital either by drilling down from a Device Vitals percentiles chart, or using Device Vital readings as a filter in device search.
We believe that some combination of Device Vitals should be central to the way teams measure the performance of devices and making it easier to get the insights and act on them unlocks more value, more easily. You can read more about all of our Device Vitals functionality in Memfault’s technical documentation.
Improved Device Timeline Navigation
We made several enhancements and improvements to the navigation experience within device timeline based on user feedback. The improvements include adding a time interval selection (e.g. 1 day or week), zoom and pan buttons.
Device timeline is central to the value Memfault provides, giving you the complete context of what’s happening on your devices. These improvements make it easier to isolate specific points of interest within the device timeline and move through the timeline more easily.